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hal-00669539v1  Conference papers
Corentin ValléeC. MannequinP. GononA. SalaünH. Grampeix et al.  Improvement of HfO2 ReRAM performances through electrode processing
2012 MRS Spring Meeting, Apr 2012, San Francisco, United States
hal-00455531v1  Conference papers
M. El KodadiM. BesacierPatrick SchiavoneI. Gereige. Développement des techniques de scatteromètrie en temps réel pour le suivi des procédés de gravure plasma
Dixième colloque international francophone Méthodes et techniques optiques pour l'industrie, 2009, Reims, France
hal-01017480v1  Journal articles
Z. FangH.Y. YuW. J. FanG. GhibaudoJ. Buckley et al.  Current Conduction Model for Oxide-Based Resistive Random Access Memory Verified by Low Frequency Noise Analysis
IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2013, 60 (Issue3), pp.1272-1275. ⟨10.1109/TED.2013.2240457⟩
hal-00596168v1  Journal articles
K.I. NaS. CristoloveanuY.H. BaeP. PatrunoW. Xiong et al.  Gate-induced floating-body effect (GIFBE) in fully depleted triple-gate n-MOSFETs
Solid-State Electronics, Elsevier, 2009, 53 (2), pp.150-153
hal-01017441v1  Journal articles
K.H. XueP. BlaiseL.R.C. FonsecaG. MolasE. Vianello et al.  Grain boundary composition and conduction in HfO2: An ab initio study
Applied Physics Letters, American Institute of Physics, 2013, 102 (20), pp.201908. ⟨10.1063/1.4807666⟩
hal-00596355v1  Journal articles
Y. XuT. MinariK. TsukagoshiJ. ChroboczekF. Balestra et al.  Origin of low-frequency noise in pentacene field-effect transistors
Solid-State Electronics, Elsevier, 2010, pp.In Press, Corrected Proof, Available online 4 February 2011
hal-00596129v1  Journal articles
K. RomanjekE. AugendreW. van den DaeleB. GrandchampL. Sanchez et al.  Improved GeOI substrates for pMOSFET off-state leakage control
Microelectronic Engineering, Elsevier, 2009, 86 (7-9), pp.1585-1588
hal-00596131v1  Journal articles
M. CharbonnierCédric LerouxV. CosnierP. BessonF. Martin et al.  Tuning the dipole at the High-/SiO2 interface in advanced metal gate stacks.
Microelectronic Engineering, Elsevier, 2009, 86, pp.1740-1742
hal-00994309v1  Journal articles
Yong XuW. ScheidelerChuan LiuF. BalestraK. Tsukagoshi. Contact thickness effects in bottom-contact coplanar organic field-effect transistors
IEEE Electron Device Letters, Institute of Electrical and Electronics Engineers, 2013, 34 (4), pp.535-7. ⟨10.1109/LED.2013.2244059⟩
hal-00147929v1  Conference papers
Yannis Le GuennecMounia LourdianeB. CabonG. MauryP. Lombard. Technologies for UWB-Over-Fiber
IEEE LEOS Laser and Electro-optics Society Annual Meeting, 2006, Grenoble, France. pp.XX
hal-00147940v1  Conference papers
K. DjerroudP. Lemaitre-AugerPh. Benech. Novel integrated polarization analyzer sensor made by ion-exchange in glass
Photonics West, 2006, SAN JOSE CA, United States. pp.XX
hal-00148178v1  Conference papers
P. LabeyeJ.E. BroquinL. LabadieP. NoëlP. Saguet et al.  Infrared single-mode hollow conductive waveguides for stellar interferometry
Photonic West, Proc. SPIE, 2006, SAN JOSE CA, United States. pp.XX
hal-00149000v1  Book sections
P. Saguet. Méthodes d'analyse numérique, chapitre I
Méthodes d'analyse numérique, chapitre I, Edition Hermès, pp.XX, 2005
hal-00149005v1  Book sections
P. Saguet. Méthodes d'analyse numérique
Méthodes d'analyse numérique, Hermès, pp.XX, 2006
hal-00148261v1  Conference papers
R. ClercP. PalestriM. FerrierQ. RafhayG. Pananakakis et al.  Perspectives du Formalisme Dérive Diffusion en Régime Quasi Ballistique pour la Modélisation Analytique des Composants MOS
GDR Nano, Journées " Simulation et Caractérisation ", 2006, GRENOBLE, France. pp.XX
hal-00148274v1  Conference papers
F. RochetteM. CasséM. MouisG. ReimboldF. Boulanger. Détermination expérimentale de la variation de la masse de conductivité des électrons dans un transistor MOS sous contrainte uniaxiale selon [110]
Journées "Simulation et caractérisation des nanocomposants" du GDR Nanoélectronique, 2006, GRENOBLE, France. pp.XX
hal-00625298v1  Journal articles
S. DemuynckH. KimC. HuffmanMaxime DarnonH. .Struyf et al.  Dielectric Reliability of 50nm Half Pitch Structures in Aurora® LK
Japanese Journal of Applied Physics, Japan Society of Applied Physics, 2009, 48, April 2009, 04C018
hal-00147861v1  Conference papers
M. El KhaldiFlorence PodevinA. Vilcot. Continuously variable phase-shift for phase array antennas
9th and 10th Nefertiti Workshops on Millimetre Wave Photonic Devices, 2005, BRUXELLES, Belgium. pp.XX