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Optical in-situ measurement of tapered optical fibers with nanometric resolution

Abstract : We propose and demonstrate a procedure to measure the profile of tapered fibers with an accuracy of a few nanometers. It can be implemented on any optical microscope. Only based on a computer analysis of the microscope images, this fast and reliable technique does not require any change on the microscope.
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https://hal.archives-ouvertes.fr/hal-01897955
Contributor : Abderrahim Azzoune <>
Submitted on : Wednesday, October 17, 2018 - 5:56:48 PM
Last modification on : Tuesday, December 8, 2020 - 10:08:54 AM
Long-term archiving on: : Friday, January 18, 2019 - 3:56:28 PM

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Abderrahim Azzoune, Philippe Delaye, Sylvie Lebrun, Maha Bouhadida, Gilles Pauliat. Optical in-situ measurement of tapered optical fibers with nanometric resolution. European Optical Society Biennial Meeting (EOSAM) 2018, Oct 2018, Delft, Netherlands. pp.533,534. ⟨hal-01897955⟩

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