Control of Yeast Fed-Batch Cultures using Minimal a priori Process Knowledge and Measurement Information

F. Renard; A. Vande Wouwer; S. Valentinotti; Didier Dumur

Journal articles

Control of Yeast Fed-Batch Cultures using Minimal a priori Process Knowledge and Measurement Information

F. Renard A. Vande Wouwer S. Valentinotti Didier Dumur ¹

1 SUPELEC-Campus Gif

Document type :

Journal articles

Domain :

Engineering Sciences [physics] / Automatic

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https://hal-supelec.archives-ouvertes.fr/hal-00279668
Contributor : Josiane Dartron Connect in order to contact the contributor
Submitted on : Thursday, May 15, 2008 - 9:31:27 AM
Last modification on : Monday, December 14, 2020 - 12:28:42 PM

Control of Yeast Fed-Batch Cultures using Minimal a priori Process Knowledge and Measurement Information

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Control of Yeast Fed-Batch Cultures using Minimal a priori Process Knowledge and Measurement Information

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