Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode

Frédéric Houzé; Pascal Chrétien; Olivier Schneegans; René Meyer; Lionel Boyer

Journal articles

Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode

Frédéric Houzé ¹ Pascal Chrétien ¹ Olivier Schneegans ¹ René Meyer ¹ Lionel Boyer ¹

1 LGEP - Laboratoire de génie électrique de Paris

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Journal articles

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https://hal-supelec.archives-ouvertes.fr/hal-00320223
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Submitted on : Wednesday, September 10, 2008 - 2:45:23 PM
Last modification on : Thursday, June 17, 2021 - 3:47:05 AM

Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode

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Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode

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