Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode

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https://hal-supelec.archives-ouvertes.fr/hal-00320223
Contributor : Olivier Schneegans <>
Submitted on : Wednesday, September 10, 2008 - 2:45:23 PM
Last modification on : Monday, December 17, 2018 - 1:26:48 AM

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  • HAL Id : hal-00320223, version 1

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Frédéric Houzé, Pascal Chrétien, Olivier Schneegans, René Meyer, Lionel Boyer. Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode. Applied Physics Letters, American Institute of Physics, 2005, 86, pp.123103. ⟨hal-00320223⟩

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