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Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

Frédéric Houzé 1 José Alvarez 1 Jean-Paul Kleider 1 P. Bergonzo E. Snidero D. Tromson
1 LGEP - Laboratoire de génie électrique de Paris
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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00320238
Contributor : Olivier Schneegans <>
Submitted on : Wednesday, September 10, 2008 - 3:00:21 PM
Last modification on : Monday, December 14, 2020 - 12:28:22 PM

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  • HAL Id : hal-00320238, version 1

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CNRS | SUPELEC | UPMC | SUP_LGEP | SORBONNE-UNIVERSITE

Citation

Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, et al.. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy. Diamond' 2005 (16th European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes and Nitrides), 2005, France. ⟨hal-00320238⟩

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