Simultaneous resistance and capacitance cartography by conducting probe AFM in contact mode

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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00320256
Contributor : Olivier Schneegans <>
Submitted on : Wednesday, September 10, 2008 - 3:18:23 PM
Last modification on : Thursday, November 22, 2018 - 2:35:21 PM

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  • HAL Id : hal-00320256, version 1

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Pascal Chrétien, Frédéric Houzé, Olivier Schneegans, René Meyer, Lionel Boyer. Simultaneous resistance and capacitance cartography by conducting probe AFM in contact mode. Xtip'05, 2005, France. ⟨hal-00320256⟩

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