Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

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https://hal-supelec.archives-ouvertes.fr/hal-00320285
Contributor : Olivier Schneegans <>
Submitted on : Wednesday, September 10, 2008 - 4:06:34 PM
Last modification on : Monday, December 17, 2018 - 1:23:21 AM

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  • HAL Id : hal-00320285, version 1

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Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, et al.. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy. Diamond and Related Materials, Elsevier, 2006, 15, pp.618-621. ⟨hal-00320285⟩

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