Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

Frédéric Houzé; José Alvarez; Jean-Paul Kleider; P. Bergonzo; E. Snidero; D. Tromson

Journal articles

Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

Frédéric Houzé ¹ José Alvarez ¹ Jean-Paul Kleider ¹ P. Bergonzo E. Snidero D. Tromson

1 LGEP - Laboratoire de génie électrique de Paris

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Journal articles

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https://hal-supelec.archives-ouvertes.fr/hal-00320285
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Submitted on : Wednesday, September 10, 2008 - 4:06:34 PM
Last modification on : Wednesday, October 21, 2020 - 2:01:34 PM

Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

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Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

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