Capacitance measurements on small parallel plate capacitors using nanoscale impedance microscopy

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https://hal-supelec.archives-ouvertes.fr/hal-00320357
Contributor : Olivier Schneegans <>
Submitted on : Wednesday, September 10, 2008 - 5:26:49 PM
Last modification on : Monday, December 17, 2018 - 1:25:41 AM

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  • HAL Id : hal-00320357, version 1

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Olivier Schneegans, Frédéric Houzé, Pascal Chrétien, René Meyer. Capacitance measurements on small parallel plate capacitors using nanoscale impedance microscopy. Applied Physics Letters, American Institute of Physics, 2007, 90, pp.043116. ⟨hal-00320357⟩

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