Electrical characterization of ITO/CuPc/Al diodes using temperature dependent capacitance spectroscopy and I-V measurements

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https://hal-supelec.archives-ouvertes.fr/hal-00320881
Contributor : Olivier Schneegans <>
Submitted on : Thursday, September 11, 2008 - 6:04:02 PM
Last modification on : Monday, May 27, 2019 - 12:02:02 PM

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  • HAL Id : hal-00320881, version 1

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F.T. Reis, Denis Mencaraglia, Sidi Ould Saad, Isabelle Séguy, M. Oukachmih, et al.. Electrical characterization of ITO/CuPc/Al diodes using temperature dependent capacitance spectroscopy and I-V measurements. Journal of Non-Crystalline Solids, Elsevier, 2004, 338-340, pp.599-602. ⟨hal-00320881⟩

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