Investigation of a-Si:H/c-Si heterojunction interface properties by admittance spectroscopy

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https://hal-supelec.archives-ouvertes.fr/hal-00321101
Contributor : Olivier Schneegans <>
Submitted on : Friday, September 12, 2008 - 12:57:04 PM
Last modification on : Friday, November 16, 2018 - 2:03:46 AM

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  • HAL Id : hal-00321101, version 1

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Alexander Gudovskikh, Jean-Paul Kleider. Investigation of a-Si:H/c-Si heterojunction interface properties by admittance spectroscopy. 4th AMS (international conference on Amorphous ans Microcrystalline Semiconductors), 2004, Russia. ⟨hal-00321101⟩

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