Analysis of the steady states photocarrier grating method for the determination of the density of states in semiconductors

J.A. Schmidt; Christophe Longeaud

Journal articles

Analysis of the steady states photocarrier grating method for the determination of the density of states in semiconductors

J.A. Schmidt Christophe Longeaud ¹

1 LGEP - Laboratoire de génie électrique de Paris

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Journal articles

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https://hal-supelec.archives-ouvertes.fr/hal-00321240
Contributor : Olivier Schneegans <>
Submitted on : Friday, September 12, 2008 - 4:11:43 PM
Last modification on : Thursday, June 17, 2021 - 3:49:56 AM

Analysis of the steady states photocarrier grating method for the determination of the density of states in semiconductors

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Analysis of the steady states photocarrier grating method for the determination of the density of states in semiconductors

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