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Characterization of a-Si:H/c-Si interface by admittance spectroscopy

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https://hal-supelec.archives-ouvertes.fr/hal-00321250
Contributor : Olivier Schneegans <>
Submitted on : Friday, September 12, 2008 - 4:19:46 PM
Last modification on : Wednesday, October 21, 2020 - 2:01:29 PM

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  • HAL Id : hal-00321250, version 1

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Alexander Gudovskikh, Jean-Paul Kleider, E.I. Terukov. Characterization of a-Si:H/c-Si interface by admittance spectroscopy. Semiconductors, 2005, 39, pp.903-909. ⟨hal-00321250⟩

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