Photoconductivity measurements used to determine the defect density within the gap of intrinsic semiconductors

J.A. Schmidt Christophe Longeaud 1 R.R. Koropecki R. Arce
1 LGEP - Laboratoire de génie électrique de Paris
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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00321562
Contributor : Olivier Schneegans <>
Submitted on : Monday, September 15, 2008 - 12:15:22 PM
Last modification on : Thursday, November 22, 2018 - 2:35:22 PM

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  • HAL Id : hal-00321562, version 1

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SUPELEC | UPMC | SUP_LGEP | SORBONNE-UNIVERSITE

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J.A. Schmidt, Christophe Longeaud, R.R. Koropecki, R. Arce. Photoconductivity measurements used to determine the defect density within the gap of intrinsic semiconductors. Hyperfine Interaction at La Plata, 2005, Argentina. ⟨hal-00321562⟩

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