Photoconductivity measurements used to determine the defect density within the gap of intrinsic semiconductors

J.A. Schmidt; Christophe Longeaud; R.R. Koropecki; R. Arce

Conference papers

Photoconductivity measurements used to determine the defect density within the gap of intrinsic semiconductors

J.A. Schmidt Christophe Longeaud ¹ R.R. Koropecki R. Arce

1 LGEP - Laboratoire de génie électrique de Paris

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Conference papers

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https://hal-supelec.archives-ouvertes.fr/hal-00321562
Contributor : Olivier Schneegans <>
Submitted on : Monday, September 15, 2008 - 12:15:22 PM
Last modification on : Wednesday, October 21, 2020 - 2:01:15 PM

Photoconductivity measurements used to determine the defect density within the gap of intrinsic semiconductors

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Photoconductivity measurements used to determine the defect density within the gap of intrinsic semiconductors

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