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Photoconductivity measurements used to determine the defect density within the gap of intrinsic semiconductors

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https://hal-supelec.archives-ouvertes.fr/hal-00321562
Contributor : Olivier Schneegans <>
Submitted on : Monday, September 15, 2008 - 12:15:22 PM
Last modification on : Thursday, June 17, 2021 - 3:47:56 AM

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  • HAL Id : hal-00321562, version 1

Citation

J.A. Schmidt, Christophe Longeaud, R.R. Koropecki, R. Arce. Photoconductivity measurements used to determine the defect density within the gap of intrinsic semiconductors. Hyperfine Interaction at La Plata, 2005, Argentina. ⟨hal-00321562⟩

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