New approach to capacitance spectroscopy for interface characterization of a-Si:H/c-Si heterojunctions

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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00321574
Contributor : Olivier Schneegans <>
Submitted on : Monday, September 15, 2008 - 12:39:12 PM
Last modification on : Friday, November 16, 2018 - 2:03:45 AM

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  • HAL Id : hal-00321574, version 1

Citation

Alexander Gudovskikh, Jean-Paul Kleider, R. Stangl. New approach to capacitance spectroscopy for interface characterization of a-Si:H/c-Si heterojunctions. 21st International Conference on Amorphous and Nanocrystalline Semiconductors, 2005, Portugal. ⟨hal-00321574⟩

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