Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00321705
Contributor : Olivier Schneegans <>
Submitted on : Monday, September 15, 2008 - 4:50:54 PM
Last modification on : Friday, November 16, 2018 - 2:03:51 AM

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  • HAL Id : hal-00321705, version 1

Citation

Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, et al.. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy. Diamond 2005, 2005, France. ⟨hal-00321705⟩

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