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Probing defect states in semiconductors by the modulated photocurrent technique

Christophe Longeaud 1
1 LGEP - Laboratoire de génie électrique de Paris
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https://hal-supelec.archives-ouvertes.fr/hal-00321715
Contributor : Olivier Schneegans <>
Submitted on : Monday, September 15, 2008 - 5:00:21 PM
Last modification on : Thursday, June 17, 2021 - 3:48:50 AM

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  • HAL Id : hal-00321715, version 1

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CNRS | SUPELEC | UPMC | SUP_LGEP | SORBONNE-UNIVERSITE | EC-PARIS

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Christophe Longeaud. Probing defect states in semiconductors by the modulated photocurrent technique. 2005. ⟨hal-00321715⟩

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