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Probing defect states in semiconductors by the modulated photocurrent technique

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https://hal-supelec.archives-ouvertes.fr/hal-00321715
Contributor : Olivier Schneegans <>
Submitted on : Monday, September 15, 2008 - 5:00:21 PM
Last modification on : Wednesday, October 21, 2020 - 2:01:01 PM

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  • HAL Id : hal-00321715, version 1

Citation

Christophe Longeaud. Probing defect states in semiconductors by the modulated photocurrent technique. 2005. ⟨hal-00321715⟩

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