New approach to capacitance spectroscopy for interface characterization of a-Si:H/c-Si heterojunctions

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Journal articles
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https://hal-supelec.archives-ouvertes.fr/hal-00321743
Contributor : Olivier Schneegans <>
Submitted on : Monday, September 15, 2008 - 5:45:18 PM
Last modification on : Monday, December 17, 2018 - 1:33:02 AM

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  • HAL Id : hal-00321743, version 1

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Alexander Gudovskikh, Jean-Paul Kleider, R. Stangl. New approach to capacitance spectroscopy for interface characterization of a-Si:H/c-Si heterojunctions. Journal of Non-Crystalline Solids, Elsevier, 2006, 352, pp.1213-1216. ⟨hal-00321743⟩

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