Comparison of optical and electrical gap of electrodeposited CuIn(S,Se)2 determined by spectral photo response and I-V-T measurements

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https://hal-supelec.archives-ouvertes.fr/hal-00321889
Contributor : Olivier Schneegans <>
Submitted on : Tuesday, September 16, 2008 - 10:31:50 AM
Last modification on : Thursday, September 12, 2019 - 5:16:05 PM

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  • HAL Id : hal-00321889, version 1

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Zakaria Djebbour, Anne Migan-Dubois, Arouna Darga, Denis Mencaraglia, Cyril Bazin, et al.. Comparison of optical and electrical gap of electrodeposited CuIn(S,Se)2 determined by spectral photo response and I-V-T measurements. E-MRS 2006, 2006, France. ⟨hal-00321889⟩

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