Local electrical and photoelectrical characterizations of diamond electronic devices by conducting probe atomic force microscopy

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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00321893
Contributor : Olivier Schneegans <>
Submitted on : Tuesday, September 16, 2008 - 10:35:03 AM
Last modification on : Wednesday, October 23, 2019 - 11:14:03 PM

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  • HAL Id : hal-00321893, version 1

Citation

José Alvarez. Local electrical and photoelectrical characterizations of diamond electronic devices by conducting probe atomic force microscopy. National Institute of Materials Science, 2006, Japan. ⟨hal-00321893⟩

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