Determination of band offsets in a-Si:H/c-Si heterojunctions from capacitance-voltage measurements: capabilities and limits

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https://hal-supelec.archives-ouvertes.fr/hal-00322077
Contributor : Olivier Schneegans <>
Submitted on : Tuesday, September 16, 2008 - 3:51:18 PM
Last modification on : Friday, December 14, 2018 - 1:28:33 AM

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  • HAL Id : hal-00322077, version 1

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A.S. Gudovskikh, Samah Ibrahim, Jean-Paul Kleider, J. Damon-Lacoste, Pere Roca I Cabarrocas, et al.. Determination of band offsets in a-Si:H/c-Si heterojunctions from capacitance-voltage measurements: capabilities and limits. Thin Solid Films, Elsevier, 2007, 515, pp.7481-7485. ⟨hal-00322077⟩

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