New method for interface characterisation in heterojunction solar cells based on diffusion capacitance measurements

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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00322267
Contributor : Olivier Schneegans <>
Submitted on : Wednesday, September 17, 2008 - 10:35:55 AM
Last modification on : Friday, November 16, 2018 - 2:03:55 AM

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  • HAL Id : hal-00322267, version 1

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A.S. Gudovskikh, V. Lantratov, Rémy Chouffot, Jean-Paul Kleider, J. Damon-Lacoste, et al.. New method for interface characterisation in heterojunction solar cells based on diffusion capacitance measurements. E-MRS 2007 Spring Meeting, 2007, France. ⟨hal-00322267⟩

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