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Digital implementation of a BIST method based on binary observations

Abstract : This article deals with a Built-in Self-Test method using only a one-bit ADC and a one-bit DAC, for use in a context of MEMS and microelectronics. It is theoretically possible to use a binary white noise and binary observations to estimate the impulse response and the output of a linear system, provided this system has good mixing properties. We show how this can be easily implemented on digital targets. The FPGA-based identification of the impulse response of a bandpass filter is performed and the experimental results are presented.
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Contributor : Karine El Rassi Connect in order to contact the contributor
Submitted on : Monday, December 15, 2008 - 9:43:06 AM
Last modification on : Monday, December 14, 2020 - 12:28:40 PM
Long-term archiving on: : Tuesday, June 8, 2010 - 5:07:54 PM


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Christophe Le Blanc, Eric Colinet, Jérôme Juillard. Digital implementation of a BIST method based on binary observations. DSD, 11th Euromicro Conference on Digital System Design; Architectures, Methods and Tools, Sep 2008, Parme, Italy. pp. 709-713, ⟨10.1109/DSD.2008.50⟩. ⟨hal-00347177⟩



Les métriques sont temporairement indisponibles