Determination of the conduction band offset between hydrogenated amorphous silicon and crystalline silicon from surface inversion layer conductance measurements

Jean-Paul Kleider; A.S. Gudovskikh; Pere Roca I Cabarrocas

Journal articles

Determination of the conduction band offset between hydrogenated amorphous silicon and crystalline silicon from surface inversion layer conductance measurements

Jean-Paul Kleider ¹ A.S. Gudovskikh Pere Roca I Cabarrocas

1 LGEP - Laboratoire de génie électrique de Paris

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Journal articles

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https://hal-supelec.archives-ouvertes.fr/hal-00350871
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Submitted on : Wednesday, January 7, 2009 - 4:58:15 PM
Last modification on : Thursday, June 17, 2021 - 3:48:05 AM

Determination of the conduction band offset between hydrogenated amorphous silicon and crystalline silicon from surface inversion layer conductance measurements

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Determination of the conduction band offset between hydrogenated amorphous silicon and crystalline silicon from surface inversion layer conductance measurements

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