Skip to Main content Skip to Navigation
Journal articles

Determination of the conduction band offset between hydrogenated amorphous silicon and crystalline silicon from surface inversion layer conductance measurements

Document type :
Journal articles
Complete list of metadatas

https://hal-supelec.archives-ouvertes.fr/hal-00350871
Contributor : Olivier Schneegans <>
Submitted on : Wednesday, January 7, 2009 - 4:58:15 PM
Last modification on : Wednesday, October 21, 2020 - 2:01:18 PM

Identifiers

  • HAL Id : hal-00350871, version 1

Citation

Jean-Paul Kleider, A.S. Gudovskikh, Pere Roca I Cabarrocas. Determination of the conduction band offset between hydrogenated amorphous silicon and crystalline silicon from surface inversion layer conductance measurements. Applied Physics Letters, American Institute of Physics, 2008, 92, pp.162101. ⟨hal-00350871⟩

Share

Metrics

Record views

138