New method for interface characterization in heterojunction solar cells based on diffusion capacitance measurements

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https://hal-supelec.archives-ouvertes.fr/hal-00350881
Contributor : Olivier Schneegans <>
Submitted on : Wednesday, January 7, 2009 - 5:03:43 PM
Last modification on : Wednesday, November 6, 2019 - 6:26:11 PM

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  • HAL Id : hal-00350881, version 1

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A.S. Gudovskikh, Rémy Chouffot, Jean-Paul Kleider, N.A. Kaluzhniy, V. Lantratov, et al.. New method for interface characterization in heterojunction solar cells based on diffusion capacitance measurements. Thin Solid Films, Elsevier, 2008, 516, pp.6786. ⟨hal-00350881⟩

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