New method for interface characterization in heterojunction solar cells based on diffusion capacitance measurements

A.S. Gudovskikh Rémy Chouffot 1 Jean-Paul Kleider 1 N.A. Kaluzhniy V. Lantratov S.A. Mintairov J. Damon-Lacoste D. Eon Pere Roca I Cabarrocas P.J. Ribeyron
1 LGEP - Laboratoire de génie électrique de Paris
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Submitted on : Wednesday, January 7, 2009 - 5:03:43 PM
Last modification on : Wednesday, November 6, 2019 - 6:26:11 PM

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A.S. Gudovskikh, Rémy Chouffot, Jean-Paul Kleider, N.A. Kaluzhniy, V. Lantratov, et al.. New method for interface characterization in heterojunction solar cells based on diffusion capacitance measurements. Thin Solid Films, Elsevier, 2008, 516, pp.6786. ⟨hal-00350881⟩

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