Characterization of amorphous/crystalline silicon interfaces from electrical measurements

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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00351211
Contributor : Olivier Schneegans <>
Submitted on : Thursday, January 8, 2009 - 4:30:52 PM
Last modification on : Saturday, November 24, 2018 - 1:46:11 AM

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  • HAL Id : hal-00351211, version 1

Citation

Jean-Paul Kleider, A.S. Gudovskikh. Characterization of amorphous/crystalline silicon interfaces from electrical measurements. MRS Spring Meeting, Mar 2008, San Francisco, United States. ⟨hal-00351211⟩

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