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Characterization of defects in semi-insulating SiC by means of Photoinduced current transient spectroscopy and modulated photocurrent technique

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https://hal-supelec.archives-ouvertes.fr/hal-00351230
Contributor : Olivier Schneegans <>
Submitted on : Thursday, January 8, 2009 - 4:56:09 PM
Last modification on : Wednesday, October 21, 2020 - 2:01:28 PM

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  • HAL Id : hal-00351230, version 1

Citation

Christophe Longeaud, Jean-Paul Kleider, P. Kaminski, R. Kozlowski. Characterization of defects in semi-insulating SiC by means of Photoinduced current transient spectroscopy and modulated photocurrent technique. XI International Conference “Physics of dielectrics”, Jun 2008, St Petersbourg, Russia. pp.CD-ROM Proceedings. ⟨hal-00351230⟩

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