Microwave characterization of dielectric materials using Bayesian neural networks

Hulusi Acikgoz 1 Yann Le Bihan 1 Olivier Meyer 1 Lionel Pichon 1
1 LGEP - Laboratoire de génie électrique de Paris
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https://hal-supelec.archives-ouvertes.fr/hal-00351284
Contributor : Thierry Leblanc <>
Submitted on : Thursday, January 8, 2009 - 7:30:22 PM
Last modification on : Wednesday, December 11, 2019 - 8:08:03 PM

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Hulusi Acikgoz, Yann Le Bihan, Olivier Meyer, Lionel Pichon. Microwave characterization of dielectric materials using Bayesian neural networks. Progress In Electromagnetics Research, EMW Publishing, 2008, 03, pp.169-182. ⟨hal-00351284⟩

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