Microwave characterization of dielectric materials using Bayesian neural networks

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https://hal-supelec.archives-ouvertes.fr/hal-00351284
Contributor : Thierry Leblanc <>
Submitted on : Thursday, January 8, 2009 - 7:30:22 PM
Last modification on : Sunday, December 9, 2018 - 1:26:49 AM

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  • HAL Id : hal-00351284, version 1

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Hulusi Acikgoz, Yann Le Bihan, Olivier Meyer, Lionel Pichon. Microwave characterization of dielectric materials using Bayesian neural networks. Progress In Electromagnetics Research, EMW Publishing, 2008, 03, pp.169-182. ⟨hal-00351284⟩

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