Microwave characterization of dielectrics materials using the combination of a finite element technique and neural networks

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Conference papers
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Submitted on : Thursday, January 8, 2009 - 8:30:50 PM
Last modification on : Wednesday, December 11, 2019 - 8:08:03 PM

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  • HAL Id : hal-00351290, version 1

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Hulusi Acikgoz, Yann Le Bihan, Olivier Meyer, Lionel Pichon. Microwave characterization of dielectrics materials using the combination of a finite element technique and neural networks. Compumag 2007, Jun 2007, Aachen, Germany. pp.933-934. ⟨hal-00351290⟩

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