Focused ion beam processing of organic crystal (TMTSF)2PF6. A combined conducting probe atomic force microscopy and secondary ion mass spectrometry study

K. Wang; Olivier Schneegans; A. Moradpour; F. Jomard

Journal articles

Focused ion beam processing of organic crystal (TMTSF)2PF6. A combined conducting probe atomic force microscopy and secondary ion mass spectrometry study

K. Wang Olivier Schneegans ¹ A. Moradpour F. Jomard

1 LGEP - Laboratoire de génie électrique de Paris

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Journal articles

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https://hal-supelec.archives-ouvertes.fr/hal-00351341
Contributor : Olivier Schneegans Connect in order to contact the contributor
Submitted on : Friday, January 9, 2009 - 10:02:24 AM
Last modification on : Thursday, June 17, 2021 - 3:46:57 AM

Focused ion beam processing of organic crystal (TMTSF)2PF6. A combined conducting probe atomic force microscopy and secondary ion mass spectrometry study

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Focused ion beam processing of organic crystal (TMTSF)2PF6. A combined conducting probe atomic force microscopy and secondary ion mass spectrometry study

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