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Focused ion beam processing of organic crystal (TMTSF)2PF6. A combined conducting probe atomic force microscopy and secondary ion mass spectrometry study

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https://hal-supelec.archives-ouvertes.fr/hal-00351341
Contributor : Olivier Schneegans <>
Submitted on : Friday, January 9, 2009 - 10:02:24 AM
Last modification on : Wednesday, October 21, 2020 - 2:01:34 PM

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  • HAL Id : hal-00351341, version 1

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K. Wang, Olivier Schneegans, A. Moradpour, F. Jomard. Focused ion beam processing of organic crystal (TMTSF)2PF6. A combined conducting probe atomic force microscopy and secondary ion mass spectrometry study. Journal of Applied Physics, American Institute of Physics, 2008, 103, pp.013711. ⟨hal-00351341⟩

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