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Influence of stress-annealing on performance of GMI in Finemet/Copper/Finemet trilayer structures

Bhaskar Kaviraj Francisco Alves 1
1 LGEP - Laboratoire de génie électrique de Paris
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Submitted on : Monday, January 19, 2009 - 4:33:04 PM
Last modification on : Sunday, December 9, 2018 - 1:25:23 AM

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  • HAL Id : hal-00354379, version 1

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Bhaskar Kaviraj, Francisco Alves. Influence of stress-annealing on performance of GMI in Finemet/Copper/Finemet trilayer structures. Physica B: Condensed Matter, Elsevier, 2008, 403, pp.1937-1941. ⟨hal-00354379⟩

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