Comparative Study of Coil Arrangements for the EC Testing of Small Surface Breaking Defects

Document type :
Journal articles
Complete list of metadatas

https://hal-supelec.archives-ouvertes.fr/hal-00354401
Contributor : Olivier Schneegans <>
Submitted on : Monday, January 19, 2009 - 5:11:27 PM
Last modification on : Wednesday, November 28, 2018 - 1:27:15 AM

Identifiers

  • HAL Id : hal-00354401, version 1

Citation

Cyril Ravat, Yann Le Bihan, Pierre-Yves Joubert, Claude Marchand. Comparative Study of Coil Arrangements for the EC Testing of Small Surface Breaking Defects. Studies in Applied Electromagnetics and Mechanics, 2008, 31, pp.288-293. ⟨hal-00354401⟩

Share

Metrics

Record views

102