Comparative Study of Coil Arrangements for the EC Testing of Small Surface Breaking Defects

Cyril Ravat 1 Yann Le Bihan 1 Pierre-Yves Joubert Claude Marchand 1
1 LGEP - Laboratoire de génie électrique de Paris
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https://hal-supelec.archives-ouvertes.fr/hal-00354401
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Submitted on : Monday, January 19, 2009 - 5:11:27 PM
Last modification on : Wednesday, November 28, 2018 - 1:27:15 AM

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Cyril Ravat, Yann Le Bihan, Pierre-Yves Joubert, Claude Marchand. Comparative Study of Coil Arrangements for the EC Testing of Small Surface Breaking Defects. Studies in Applied Electromagnetics and Mechanics, 2008, 31, pp.288-293. ⟨hal-00354401⟩

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