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An original apparatus for endurance testing of MEMS electrical contact materials

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https://hal-supelec.archives-ouvertes.fr/hal-00445399
Contributor : Olivier Schneegans <>
Submitted on : Friday, January 8, 2010 - 12:45:43 PM
Last modification on : Wednesday, October 21, 2020 - 2:01:25 PM

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  • HAL Id : hal-00445399, version 1

Citation

M. Vincent, L. Chiesi, P. Rousset, C. Lapierre, C. Poulain, et al.. An original apparatus for endurance testing of MEMS electrical contact materials. 55th Holm Conference on Electrical Contacts, Sep 2009, Vancouver, Canada. pp. 285-289. ⟨hal-00445399⟩

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