Evaluating Properties of Graphene Sheets using Conductive Probe Atomic Force Microscopy

Fanny Hauquier 1 David Alamarguy 1 Sophie Noël 1 P. Viel
1 LGEP - Laboratoire de génie électrique de Paris
Document type :
Conference papers
Complete list of metadatas
https://hal-supelec.archives-ouvertes.fr/hal-00445400
Contributor : Olivier Schneegans <>
Submitted on : Friday, January 8, 2010 - 12:45:54 PM
Last modification on : Friday, November 30, 2018 - 1:26:10 AM

Identifiers

  • HAL Id : hal-00445400, version 1

Collections

CNRS | SUPELEC | UPMC | SUP_LGEP | SORBONNE-UNIVERSITE

Citation

Fanny Hauquier, David Alamarguy, Sophie Noël, P. Viel. Evaluating Properties of Graphene Sheets using Conductive Probe Atomic Force Microscopy. MRS Fall Meeting, Nov 2009, Boston, United States. pp.K10.44. ⟨hal-00445400⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

168

Contact

CCSD