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Conference papers

Evaluating Properties of Graphene Sheets using Conductive Probe Atomic Force Microscopy

Fanny Hauquier 1 David Alamarguy 1 Sophie Noël 1 P. Viel
1 LGEP - Laboratoire de génie électrique de Paris
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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00445400
Contributor : Olivier Schneegans Connect in order to contact the contributor
Submitted on : Friday, January 8, 2010 - 12:45:54 PM
Last modification on : Thursday, June 17, 2021 - 3:49:03 AM

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  • HAL Id : hal-00445400, version 1

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CNRS | SUPELEC | UPMC | SUP_LGEP | SORBONNE-UNIVERSITE | EC-PARIS

Citation

Fanny Hauquier, David Alamarguy, Sophie Noël, P. Viel. Evaluating Properties of Graphene Sheets using Conductive Probe Atomic Force Microscopy. MRS Fall Meeting, Nov 2009, Boston, United States. pp.K10.44. ⟨hal-00445400⟩

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