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Evaluating Properties of Graphene Sheets using Conductive Probe Atomic Force Microscopy

Fanny Hauquier 1 David Alamarguy 1 Sophie Noël 1 P. Viel
1 LGEP - Laboratoire de génie électrique de Paris
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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00445400
Contributor : Olivier Schneegans <>
Submitted on : Friday, January 8, 2010 - 12:45:54 PM
Last modification on : Wednesday, October 21, 2020 - 2:01:24 PM

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  • HAL Id : hal-00445400, version 1

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CNRS | SUPELEC | UPMC | SUP_LGEP | SORBONNE-UNIVERSITE

Citation

Fanny Hauquier, David Alamarguy, Sophie Noël, P. Viel. Evaluating Properties of Graphene Sheets using Conductive Probe Atomic Force Microscopy. MRS Fall Meeting, Nov 2009, Boston, United States. pp.K10.44. ⟨hal-00445400⟩

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