Evaluating Properties of Graphene Sheets using Conductive Probe Atomic Force Microscopy

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https://hal-supelec.archives-ouvertes.fr/hal-00445400
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Submitted on : Friday, January 8, 2010 - 12:45:54 PM
Last modification on : Friday, November 30, 2018 - 1:26:10 AM

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  • HAL Id : hal-00445400, version 1

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Fanny Hauquier, David Alamarguy, Sophie Noël, P. Viel. Evaluating Properties of Graphene Sheets using Conductive Probe Atomic Force Microscopy. MRS Fall Meeting, Nov 2009, Boston, United States. pp.K10.44. ⟨hal-00445400⟩

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