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Evaluating Properties of Graphene Sheets using Conductive Probe Atomic Force Microscopy

Fanny Hauquier 1 David Alamarguy 1 Sophie Noël 1 P. Viel
1 LGEP - Laboratoire de génie électrique de Paris
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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00445400
Contributor : Olivier Schneegans <>
Submitted on : Friday, January 8, 2010 - 12:45:54 PM
Last modification on : Thursday, June 17, 2021 - 3:49:03 AM

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  • HAL Id : hal-00445400, version 1

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CNRS | SUPELEC | UPMC | SUP_LGEP | SORBONNE-UNIVERSITE | EC-PARIS

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Fanny Hauquier, David Alamarguy, Sophie Noël, P. Viel. Evaluating Properties of Graphene Sheets using Conductive Probe Atomic Force Microscopy. MRS Fall Meeting, Nov 2009, Boston, United States. pp.K10.44. ⟨hal-00445400⟩

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