Christophe Longeaud, Jean-Paul Kleider, P. Kaminski, R. Kozlowski, M. Miczuga. Characterization of defect levels in semi−insulating 6H−SiC by means of photoinduced transient spectroscopyand modulated photocurrent technique.
Journal of Physics: Condensed Matter, IOP Publishing, 2009, 21, pp. 045801-045815.
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