Electronic and structural properties of the amorphous/crystalline silicon interface

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https://hal-supelec.archives-ouvertes.fr/hal-00445964
Contributor : Olivier Schneegans <>
Submitted on : Monday, January 11, 2010 - 4:16:19 PM
Last modification on : Friday, December 14, 2018 - 1:26:10 AM

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  • HAL Id : hal-00445964, version 1

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Jean-Paul Kleider, Rémy Chouffot, A.S. Gudovskikh, Pere Roca I Cabarrocas, M. Labrune, et al.. Electronic and structural properties of the amorphous/crystalline silicon interface. Thin Solid Films, Elsevier, 2009, 517, pp. 6386-6391. ⟨hal-00445964⟩

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