Electronic and structural properties of the amorphous/crystalline silicon interface

Jean-Paul Kleider; Rémy Chouffot; A.S. Gudovskikh; Pere Roca I Cabarrocas; M. Labrune; P.J. Ribeyron; R. Brüggemann

Journal articles

Electronic and structural properties of the amorphous/crystalline silicon interface

Jean-Paul Kleider ¹ Rémy Chouffot ¹ A.S. Gudovskikh Pere Roca I Cabarrocas M. Labrune P.J. Ribeyron R. Brüggemann

1 LGEP - Laboratoire de génie électrique de Paris

Document type :

Journal articles

Complete list of metadatas

https://hal-supelec.archives-ouvertes.fr/hal-00445964
Contributor : Olivier Schneegans <>
Submitted on : Monday, January 11, 2010 - 4:16:19 PM
Last modification on : Monday, December 14, 2020 - 12:28:40 PM

Electronic and structural properties of the amorphous/crystalline silicon interface

Identifiers

Collections

Citation

Export

Metrics

227

Electronic and structural properties of the amorphous/crystalline silicon interface

Identifiers

Collections

Citation

Export

Share

Metrics

227