Electronic and structural properties of the amorphous/crystalline silicon interface

Jean-Paul Kleider; Rémy Chouffot; A.S. Gudovskikh; Pere Roca I Cabarrocas; M. Labrune; P.J. Ribeyron; R. Brüggemann

Journal articles

Electronic and structural properties of the amorphous/crystalline silicon interface

Jean-Paul Kleider ¹ Rémy Chouffot ¹ A.S. Gudovskikh Pere Roca I Cabarrocas M. Labrune P.J. Ribeyron R. Brüggemann

1 LGEP - Laboratoire de génie électrique de Paris

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Journal articles

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https://hal-supelec.archives-ouvertes.fr/hal-00445964
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Submitted on : Monday, January 11, 2010 - 4:16:19 PM
Last modification on : Wednesday, October 21, 2020 - 2:01:35 PM

Electronic and structural properties of the amorphous/crystalline silicon interface

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Electronic and structural properties of the amorphous/crystalline silicon interface

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