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Study of the interfacial properties of amorphous Silicon n type crystalline Silicon heterojunction through static coplanar conductance measurements

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https://hal-supelec.archives-ouvertes.fr/hal-00446015
Contributor : Olivier Schneegans <>
Submitted on : Monday, January 11, 2010 - 5:01:41 PM
Last modification on : Wednesday, October 21, 2020 - 2:01:16 PM

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  • HAL Id : hal-00446015, version 1

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Wilfried Favre, M. Labrune, Foudil Dadouche, A.S. Gudovskikh, Pere Roca I Cabarrocas, et al.. Study of the interfacial properties of amorphous Silicon n type crystalline Silicon heterojunction through static coplanar conductance measurements. 23rd International Conference on Amorphous and Nanocrystalline Semiconductors, ICANS23, 2009, Utrecht, Netherlands. ⟨hal-00446015⟩

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