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Study of the Degrees of Freedom Management of Dual Formulations for the Modelling of Thin Cracks in Eddy Current Testing

Yahya Choua 1 Laurent Santandréa 1 Yann Le Bihan 1 Claude Marchand 1
1 LGEP - Laboratoire de génie électrique de Paris
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https://hal-supelec.archives-ouvertes.fr/hal-00447220
Contributor : Olivier Schneegans <>
Submitted on : Thursday, January 14, 2010 - 3:39:40 PM
Last modification on : Friday, December 14, 2018 - 1:28:20 AM

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  • HAL Id : hal-00447220, version 1

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Yahya Choua, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Study of the Degrees of Freedom Management of Dual Formulations for the Modelling of Thin Cracks in Eddy Current Testing. Sensor letters, American Scientific Publishers, 2009, 7 (5), pp. 475-479. ⟨hal-00447220⟩

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