Study of the Degrees of Freedom Management of Dual Formulations for the Modelling of Thin Cracks in Eddy Current Testing

Document type :
Journal articles
Complete list of metadatas

https://hal-supelec.archives-ouvertes.fr/hal-00447220
Contributor : Olivier Schneegans <>
Submitted on : Thursday, January 14, 2010 - 3:39:40 PM
Last modification on : Friday, December 14, 2018 - 1:28:20 AM

Identifiers

  • HAL Id : hal-00447220, version 1

Citation

Yahya Choua, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Study of the Degrees of Freedom Management of Dual Formulations for the Modelling of Thin Cracks in Eddy Current Testing. Sensor letters, American Scientific Publishers, 2009, 7 (5), pp. 475-479. ⟨hal-00447220⟩

Share

Metrics

Record views

149