Study of the Degrees of Freedom Management of Dual Formulations for the Modelling of Thin Cracks in Eddy Current Testing

Yahya Choua; Laurent Santandréa; Yann Le Bihan; Claude Marchand

Journal articles

Study of the Degrees of Freedom Management of Dual Formulations for the Modelling of Thin Cracks in Eddy Current Testing

Yahya Choua ¹ Laurent Santandréa ¹ Yann Le Bihan ¹ Claude Marchand ¹

1 LGEP - Laboratoire de génie électrique de Paris

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Journal articles

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https://hal-supelec.archives-ouvertes.fr/hal-00447220
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Submitted on : Thursday, January 14, 2010 - 3:39:40 PM
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Study of the Degrees of Freedom Management of Dual Formulations for the Modelling of Thin Cracks in Eddy Current Testing

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Study of the Degrees of Freedom Management of Dual Formulations for the Modelling of Thin Cracks in Eddy Current Testing

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