Skip to Main content Skip to Navigation
Journal articles

Study of the Degrees of Freedom Management of Dual Formulations for the Modelling of Thin Cracks in Eddy Current Testing

Yahya Choua 1 Laurent Santandréa 1 Yann Le Bihan 1 Claude Marchand 1
1 LGEP - Laboratoire de génie électrique de Paris
Document type :
Journal articles
Complete list of metadata
https://hal-supelec.archives-ouvertes.fr/hal-00447220
Contributor : Olivier Schneegans <>
Submitted on : Thursday, January 14, 2010 - 3:39:40 PM
Last modification on : Thursday, June 17, 2021 - 3:48:40 AM

Identifiers

  • HAL Id : hal-00447220, version 1

Collections

CNRS | SUPELEC | UPMC | SUP_LGEP | SORBONNE-UNIVERSITE | EC-PARIS

Citation

Yahya Choua, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Study of the Degrees of Freedom Management of Dual Formulations for the Modelling of Thin Cracks in Eddy Current Testing. Sensor letters, American Scientific Publishers, 2009, 7 (5), pp. 475-479. ⟨hal-00447220⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

201