https://hal-supelec.archives-ouvertes.fr/hal-00447228 Contributor : Olivier SchneegansConnect in order to contact the contributor Submitted on : Thursday, January 14, 2010 - 3:39:41 PM Last modification on : Saturday, March 5, 2022 - 3:31:04 AM
Cyril Ravat, Yann Le Bihan, Pierre-Yves Joubert, Claude Marchand. Non-destructive evaluation of small defects using an eddy current microcoil sensor array. Sensor letters, American Scientific Publishers, 2009, 7 (3), pp. 400-405. ⟨hal-00447228⟩