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Non-destructive evaluation of small defects using an eddy current microcoil sensor array

Cyril Ravat 1 Yann Le Bihan 1 Pierre-Yves Joubert Claude Marchand 1
1 LGEP - Laboratoire de génie électrique de Paris
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https://hal-supelec.archives-ouvertes.fr/hal-00447228
Contributor : Olivier Schneegans <>
Submitted on : Thursday, January 14, 2010 - 3:39:41 PM
Last modification on : Thursday, June 17, 2021 - 3:49:05 AM

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  • HAL Id : hal-00447228, version 1

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CNRS | SUPELEC | UPMC | SUP_LGEP | SORBONNE-UNIVERSITE | EC-PARIS

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Cyril Ravat, Yann Le Bihan, Pierre-Yves Joubert, Claude Marchand. Non-destructive evaluation of small defects using an eddy current microcoil sensor array. Sensor letters, American Scientific Publishers, 2009, 7 (3), pp. 400-405. ⟨hal-00447228⟩

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