Non-destructive evaluation of small defects using an eddy current microcoil sensor array

Cyril Ravat 1 Yann Le Bihan 1 Pierre-Yves Joubert Claude Marchand 1
1 LGEP - Laboratoire de génie électrique de Paris
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Submitted on : Thursday, January 14, 2010 - 3:39:41 PM
Last modification on : Friday, December 14, 2018 - 1:28:31 AM

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Cyril Ravat, Yann Le Bihan, Pierre-Yves Joubert, Claude Marchand. Non-destructive evaluation of small defects using an eddy current microcoil sensor array. Sensor letters, American Scientific Publishers, 2009, 7 (3), pp. 400-405. ⟨hal-00447228⟩

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