Mesh Refinement in Eddy Current Testing with Separated T-R probes

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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00447250
Contributor : Olivier Schneegans <>
Submitted on : Thursday, January 14, 2010 - 3:46:39 PM
Last modification on : Friday, November 23, 2018 - 9:50:40 AM

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  • HAL Id : hal-00447250, version 1

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Yahya Choua, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Mesh Refinement in Eddy Current Testing with Separated T-R probes. COMPUMAG, Nov 2009, Florianópolis, Brazil. pp. 1048-1049. ⟨hal-00447250⟩

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