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Communication Dans Un Congrès Année : 2010

Temperature-Power Consumption Relationship and Hot-spot Migration for FPGA-based System

Résumé

Heat emission and temperature control in an electronic device is known to be highly correlated to power consumption as well as to equipment's reliability. Within this context, this paper discusses a possible solution to restrict processing component's heat emission in FPGA-based system (e.g., Cognitive Radio (CR) equipment). It also describes the implementation, on reconfigurable FPGA based circuit, of a digital thermal sensor, analyzes the applicability of local heat estimations, and empirically describes the temperature-power consumption relationship in a dynamically reconfigurable FPGA platform. Finally, discussions are conducted on the decision making issues related to the use of such sensors to enable "hot-spot" migration in CR equipment.

Domaines

Electronique
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Dates et versions

hal-00552125 , version 1 (05-01-2011)

Identifiants

  • HAL Id : hal-00552125 , version 1

Citer

Xun Zhang, Wassim Jouini, Pierre Leray, Jacques Palicot. Temperature-Power Consumption Relationship and Hot-spot Migration for FPGA-based System. GreenCom2010, Dec 2010, Hangzhou, China. 6 p. ⟨hal-00552125⟩
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