Temperature Measurement of Copper Contact Surfaces

Romaric Landfried 1 Thierry Leblanc 1 Richard Andlauer 1 T. Klonowski Philippe Testé 1
1 LGEP - Laboratoire de génie électrique de Paris
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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00554772
Contributor : Olivier Schneegans <>
Submitted on : Tuesday, January 11, 2011 - 1:06:31 PM
Last modification on : Friday, September 13, 2019 - 11:44:06 AM

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  • HAL Id : hal-00554772, version 1

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Romaric Landfried, Thierry Leblanc, Richard Andlauer, T. Klonowski, Philippe Testé. Temperature Measurement of Copper Contact Surfaces. 25th ICEC and 56th Holm Conference on Electrical Contacts, Oct 2010, Charleston, United States. pp.148-152. ⟨hal-00554772⟩

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