Temperature Measurement of Copper Contact Surfaces

Romaric Landfried 1 Thierry Leblanc 1 Richard Andlauer 1 T. Klonowski Philippe Testé 1
1 LGEP - Laboratoire de génie électrique de Paris
Document type :
Conference papers
Complete list of metadatas
https://hal-supelec.archives-ouvertes.fr/hal-00554772
Contributor : Olivier Schneegans <>
Submitted on : Tuesday, January 11, 2011 - 1:06:31 PM
Last modification on : Friday, September 13, 2019 - 11:44:06 AM

Identifiers

  • HAL Id : hal-00554772, version 1

Collections

UPMC | SUPELEC | SUP_LGEP | SORBONNE-UNIVERSITE

Citation

Romaric Landfried, Thierry Leblanc, Richard Andlauer, T. Klonowski, Philippe Testé. Temperature Measurement of Copper Contact Surfaces. 25th ICEC and 56th Holm Conference on Electrical Contacts, Oct 2010, Charleston, United States. pp.148-152. ⟨hal-00554772⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

127

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD