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Study of the interfacial properties of amorphous Silicon/n-type crystalline Silicon heterojunction through static coplanar conductance measurements

Wilfried Favre 1 M. Labrune Foudil Dadouche 1 A.S. Gudovskikh Pere Roca I Cabarrocas Jean-Paul Kleider 1
1 LGEP - Laboratoire de génie électrique de Paris
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https://hal-supelec.archives-ouvertes.fr/hal-00555226
Contributor : Olivier Schneegans Connect in order to contact the contributor
Submitted on : Wednesday, January 12, 2011 - 5:18:17 PM
Last modification on : Thursday, June 17, 2021 - 3:47:21 AM

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  • HAL Id : hal-00555226, version 1

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Wilfried Favre, M. Labrune, Foudil Dadouche, A.S. Gudovskikh, Pere Roca I Cabarrocas, et al.. Study of the interfacial properties of amorphous Silicon/n-type crystalline Silicon heterojunction through static coplanar conductance measurements. physica status solidi (c), Wiley, 2010, 7 (3), pp.1037-1040. ⟨hal-00555226⟩

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