Study of the interfacial properties of amorphous Silicon/n-type crystalline Silicon heterojunction through static coplanar conductance measurements

Wilfried Favre; M. Labrune; Foudil Dadouche; A.S. Gudovskikh; Pere Roca I Cabarrocas; Jean-Paul Kleider

Journal articles

Study of the interfacial properties of amorphous Silicon/n-type crystalline Silicon heterojunction through static coplanar conductance measurements

Wilfried Favre ¹ M. Labrune Foudil Dadouche ¹ A.S. Gudovskikh Pere Roca I Cabarrocas Jean-Paul Kleider ¹

1 LGEP - Laboratoire de génie électrique de Paris

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https://hal-supelec.archives-ouvertes.fr/hal-00555226
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Submitted on : Wednesday, January 12, 2011 - 5:18:17 PM
Last modification on : Monday, December 14, 2020 - 12:28:46 PM

Study of the interfacial properties of amorphous Silicon/n-type crystalline Silicon heterojunction through static coplanar conductance measurements

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Study of the interfacial properties of amorphous Silicon/n-type crystalline Silicon heterojunction through static coplanar conductance measurements

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