Study of the interfacial properties of amorphous Silicon/n-type crystalline Silicon heterojunction through static coplanar conductance measurements

Wilfried Favre; M. Labrune; Foudil Dadouche; A.S. Gudovskikh; Pere Roca I Cabarrocas; Jean-Paul Kleider

Journal articles

Study of the interfacial properties of amorphous Silicon/n-type crystalline Silicon heterojunction through static coplanar conductance measurements

Wilfried Favre ¹ M. Labrune Foudil Dadouche ¹ A.S. Gudovskikh Pere Roca I Cabarrocas Jean-Paul Kleider ¹

1 LGEP - Laboratoire de génie électrique de Paris

Document type :

Journal articles

Complete list of metadatas

https://hal-supelec.archives-ouvertes.fr/hal-00555226
Contributor : Olivier Schneegans <>
Submitted on : Wednesday, January 12, 2011 - 5:18:17 PM
Last modification on : Wednesday, October 21, 2020 - 2:01:20 PM

Study of the interfacial properties of amorphous Silicon/n-type crystalline Silicon heterojunction through static coplanar conductance measurements

Identifiers

Collections

Citation

Export

Metrics

110

Study of the interfacial properties of amorphous Silicon/n-type crystalline Silicon heterojunction through static coplanar conductance measurements

Identifiers

Collections

Citation

Export

Share

Metrics

110