Conductive-atomic force microscopy characterization of silicon nanowires

Document type :
Conference papers
Complete list of metadatas

https://hal-supelec.archives-ouvertes.fr/hal-00555251
Contributor : Olivier Schneegans <>
Submitted on : Wednesday, January 12, 2011 - 5:23:05 PM
Last modification on : Wednesday, October 23, 2019 - 11:14:03 PM

Identifiers

  • HAL Id : hal-00555251, version 1

Citation

José Alvarez, Irène Ngo, Marie-Estelle Gueunier-Farret, Jean-Paul Kleider, Lianbo Yu, et al.. Conductive-atomic force microscopy characterization of silicon nanowires. E-MRS 2010 Fall Meeting, Sep 2010, Varsovie, Poland. ⟨hal-00555251⟩

Share

Metrics

Record views

163