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Capacitance techniques for the evaluation of electronic properties and defects in disordered thin film semiconductors

Jean-Paul Kleider 1
1 LGEP - Laboratoire de génie électrique de Paris
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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00555256
Contributor : Olivier Schneegans Connect in order to contact the contributor
Submitted on : Wednesday, January 12, 2011 - 5:23:28 PM
Last modification on : Thursday, June 17, 2021 - 3:49:50 AM

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  • HAL Id : hal-00555256, version 1

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Jean-Paul Kleider. Capacitance techniques for the evaluation of electronic properties and defects in disordered thin film semiconductors. 7th International Conference on amorphous and microcrystalline semiconductors, Jun 2010, Saint-Petersburg, Russia. pp.00. ⟨hal-00555256⟩

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