Capacitance techniques for the evaluation of electronic properties and defects in disordered thin film semiconductors

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Submitted on : Wednesday, January 12, 2011 - 5:23:28 PM
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Jean-Paul Kleider. Capacitance techniques for the evaluation of electronic properties and defects in disordered thin film semiconductors. 7th International Conference on amorphous and microcrystalline semiconductors, Jun 2010, Saint-Petersburg, Russia. pp.00. ⟨hal-00555256⟩

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