Tarik Hacib, Hulusi Acikgoz, Yann Le Bihan, Mohamed Rachid Mekideche, Olivier Meyer, et al.. Support vector machines for measuring dielectric properties of materials.
COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, Emerald, 2010, 29 (4), pp.1081-1089.
⟨hal-00555259⟩