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Comparison of two methods for modeling thin regions in eddy current non-destructive testing

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Conference papers
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https://hal-supelec.archives-ouvertes.fr/hal-00555709
Contributor : Olivier Schneegans <>
Submitted on : Friday, January 14, 2011 - 11:24:48 AM
Last modification on : Wednesday, October 21, 2020 - 2:01:26 PM

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  • HAL Id : hal-00555709, version 1

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Alejandro Ospina Vargas, Houda Zaidi, Laurent Santandréa, Guillaume Krebs, Yann Le Bihan. Comparison of two methods for modeling thin regions in eddy current non-destructive testing. CEFC 2010, May 2010, Chicago, IL, United States. ⟨hal-00555709⟩

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