Fast simulation method of multiple narrow cracks in planar stratified media

Roberto Miorelli 1 Christophe Reboud 1 Dominique Lesselier 2 Theodoros Theodoulidis 3
1 DISC - Département Imagerie et Simulation pour le Contrôle
2 DRE - Département de Recherche en Electromagnétisme ; EMG - Département Electromagnétisme - L2S
L2S - Laboratoire des signaux et systèmes : 1289, SUPELEC-Campus Gif
3 Department of Mechanical Engineering
Abstract : This contribution presents a fast simulation technique of eddy-current testing (ECT) signals due to thin cracks embedded in a planar stratified medium. Starting from the Boundary Element Method (BEM) approach for ideal and narrow cracks, a collaborative work by the authors has led to the development of a more general semi-analytical model treating several parallel and/or orthogonal thin cracks embedded in a planar multilayered structure, without any constraint on the numbers of layers or flaws. Simulation results obtained with this method have been compared with experimental data, results from literature and Finite Element Method (FEM). The theoretical approach and results obtained are presented and discussed, as well as some perspectives for further developments.
Keywords : generalized pencil of functions method discrete complex image method Eddy current testing thin cracks semi-analytical modeling boundary element method
Document type :
Conference papers
Complete list of metadatas
https://hal-supelec.archives-ouvertes.fr/hal-00640488
Contributor : Dominique Lesselier <>
Submitted on : Saturday, November 12, 2011 - 10:43:38 AM
Last modification on : Wednesday, January 23, 2019 - 2:39:24 PM

Identifiers

  • HAL Id : hal-00640488, version 1

Collections

CEA | SUP_LSS | SUPELEC | L2S | DRT | LIST | SUP_EMG

Citation

Roberto Miorelli, Christophe Reboud, Dominique Lesselier, Theodoros Theodoulidis. Fast simulation method of multiple narrow cracks in planar stratified media. 16th International Workshop on Electromagnetic Non-Destructive Evaluation (ENDE'11), Mar 2011, Madras (Chennai), France. pp.CD-ROM. ⟨hal-00640488⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

251

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD