Characterization of Electrical Transverse Conductivity of Space Dielectric Materials

Abstract : The effect of ionizing radiation processes and electron penetration depth on the dielectric properties of a 127μm Teflon FEP sample was investigated by surface potential measurements. We have been able to reveal the presence of a transverse conductivity that is enhanced by radiation ionisation process. The irradiation tests performed as a function of the irradiation energy revealed a strong influence of the electron penetration depth on the intrinsic transverse conductivity: this feature might be assigned to the evolution of traps density with the penetration depth.
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Conference papers
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Submitted on : Wednesday, January 4, 2012 - 4:51:41 PM
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Rachel Hanna, Thierry Paulmier, M. Belhaj, Philippe Molinié, Bernard Dirassen, et al.. Characterization of Electrical Transverse Conductivity of Space Dielectric Materials. 14th International Symposium on Electrets (ISE 14), Aug 2011, Montpellier, France. 21p., ⟨10.1109/ISE.2011.6084962⟩. ⟨hal-00656636⟩

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