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Characterization of charge carrier lateral conduction in irradiated dielectric materials

Abstract : A characterization method for surface charging analysis on insulators submitted to electron irradiation has been developed. This method, based on the use of two Kelvin probes (KPs), provides details on the transit time motion for injection of both holes and electrons. It can also be used to assess the isotropy of lateral electrical conduction on the sample. The feasibility of this method was tested on fluorinated ethylene propylene (Teflon® FEP) samples. It was found that central electron injection induces rapid surface charge spreading, in contrast to injection of holes. An electrical anisotropic behaviour of the sample was also detected.
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Submitted on : Tuesday, April 10, 2012 - 11:16:17 AM
Last modification on : Friday, June 26, 2020 - 2:00:04 PM

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Rachel Hanna, Thierry Paulmier, M. Belhaj, Philippe Molinié, Bernard Dirassen, et al.. Characterization of charge carrier lateral conduction in irradiated dielectric materials. Journal of Physics D: Applied Physics, IOP Publishing, 2011, 44 (44), pp.445402.1-445402.5. ⟨10.1088/0022-3727/44/44/445402⟩. ⟨hal-00686424⟩

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