Resistive Switching Phenomena in LixCoO2 Thin Fillms

Abstract : A substantial resistive switching of LixCoO2 mixed-conductor thin films is observed for the first time. The occurrence of possible bipolar switching in these oxide thin films is by current-voltage curves, investigated by conducting-probe atomic force microscopy (CP-AFM). The films are incorporated into an {Au/LixCoO2/p++Si} device and exhibit a significant resistive-switching process involving a ratio of over four orders of magnitude.
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Submitted on : Thursday, June 21, 2012 - 11:19:38 AM
Last modification on : Thursday, December 20, 2018 - 1:26:48 AM

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Alec Moradpour, Olivier Schneegans, Sylvain Franger, Alexandre Revcolevschi, Raphaël Salot, et al.. Resistive Switching Phenomena in LixCoO2 Thin Fillms. Advanced Materials, Wiley-VCH Verlag, 2011, 23 (36), pp.4141-4145. ⟨10.1002/adma.201101800⟩. ⟨hal-00710602⟩

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